JPS5628295B2 - - Google Patents

Info

Publication number
JPS5628295B2
JPS5628295B2 JP6290977A JP6290977A JPS5628295B2 JP S5628295 B2 JPS5628295 B2 JP S5628295B2 JP 6290977 A JP6290977 A JP 6290977A JP 6290977 A JP6290977 A JP 6290977A JP S5628295 B2 JPS5628295 B2 JP S5628295B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP6290977A
Other languages
Japanese (ja)
Other versions
JPS533143A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS533143A publication Critical patent/JPS533143A/ja
Publication of JPS5628295B2 publication Critical patent/JPS5628295B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2215—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test error correction or detection circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/04—Generating or distributing clock signals or signals derived directly therefrom
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/15—Arrangements in which pulses are delivered at different times at several outputs, i.e. pulse distributors
    • H03K5/151—Arrangements in which pulses are delivered at different times at several outputs, i.e. pulse distributors with two complementary outputs
    • H03K5/1515—Arrangements in which pulses are delivered at different times at several outputs, i.e. pulse distributors with two complementary outputs non-overlapping

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Manipulation Of Pulses (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP6290977A 1976-06-30 1977-05-31 Clock generator semiconductor chip Granted JPS533143A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/701,376 US4063078A (en) 1976-06-30 1976-06-30 Clock generation network for level sensitive logic system

Publications (2)

Publication Number Publication Date
JPS533143A JPS533143A (en) 1978-01-12
JPS5628295B2 true JPS5628295B2 (en]) 1981-07-01

Family

ID=24817113

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6290977A Granted JPS533143A (en) 1976-06-30 1977-05-31 Clock generator semiconductor chip

Country Status (6)

Country Link
US (1) US4063078A (en])
JP (1) JPS533143A (en])
DE (1) DE2723707C2 (en])
FR (1) FR2356996A1 (en])
GB (1) GB1581866A (en])
IT (1) IT1114796B (en])

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0372896U (en]) * 1989-11-16 1991-07-23

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2842750A1 (de) * 1978-09-30 1980-04-10 Ibm Deutschland Verfahren und anordnung zur pruefung von durch monolithisch integrierten halbleiterschaltungen dargestellten sequentiellen schaltungen
GB2030807B (en) * 1978-10-02 1982-11-10 Ibm Latch circuit
JPS5921045B2 (ja) * 1978-12-20 1984-05-17 富士通株式会社 クロツク信号分配回路の調整方式
US4463440A (en) * 1980-04-15 1984-07-31 Sharp Kabushiki Kaisha System clock generator in integrated circuit
DE3029883A1 (de) * 1980-08-07 1982-03-11 Ibm Deutschland Gmbh, 7000 Stuttgart Schieberegister fuer pruef- und test-zwecke
DE3030299A1 (de) 1980-08-09 1982-04-08 Ibm Deutschland Gmbh, 7000 Stuttgart Schieberegister fuer pruef- und test-zwecke
US4441075A (en) * 1981-07-02 1984-04-03 International Business Machines Corporation Circuit arrangement which permits the testing of each individual chip and interchip connection in a high density packaging structure having a plurality of interconnected chips, without any physical disconnection
US4503386A (en) * 1982-04-20 1985-03-05 International Business Machines Corporation Chip partitioning aid (CPA)-A structure for test pattern generation for large logic networks
US4477738A (en) * 1982-06-14 1984-10-16 Ibm Corporation LSSD Compatible clock driver
US4564943A (en) * 1983-07-05 1986-01-14 International Business Machines System path stressing
US4580137A (en) * 1983-08-29 1986-04-01 International Business Machines Corporation LSSD-testable D-type edge-trigger-operable latch with overriding set/reset asynchronous control
US4542509A (en) * 1983-10-31 1985-09-17 International Business Machines Corporation Fault testing a clock distribution network
USRE34052E (en) * 1984-05-31 1992-09-01 International Business Machines Corporation Data processing system with CPU register to register data transfers overlapped with data transfer to and from main storage
US4630195A (en) * 1984-05-31 1986-12-16 International Business Machines Corporation Data processing system with CPU register to register data transfers overlapped with data transfer to and from main storage
JPS61105700A (ja) * 1984-10-29 1986-05-23 東洋通信機株式会社 航空機衝突防止装置に於ける他航空機トラツキング表示方式
US4858179A (en) * 1985-11-14 1989-08-15 International Business Machines Corporation Apparatus for determining the minimum number of storage elements required to store the states of a circuit
US4800564A (en) * 1986-09-29 1989-01-24 International Business Machines Corporation High performance clock system error detection and fault isolation
JPS63180660U (en]) * 1987-05-13 1988-11-22
JPH085978Y2 (ja) * 1988-10-04 1996-02-21 富士電機株式会社 紙葉類の積層収納装置
JPH0797328B2 (ja) * 1988-10-25 1995-10-18 インターナシヨナル・ビジネス・マシーンズ・コーポレーシヨン フオールト・トレラント同期システム
US5018111A (en) * 1988-12-27 1991-05-21 Intel Corporation Timing circuit for memory employing reset function
US5018144A (en) * 1989-04-28 1991-05-21 International Business Machines Corporation Logic performance verification and transition fault detection
US5684808A (en) * 1995-09-19 1997-11-04 Unisys Corporation System and method for satisfying mutually exclusive gating requirements in automatic test pattern generation systems
DE10028369C2 (de) * 2000-06-08 2002-06-06 Siemens Ag Schaltungsanordnung zur Aufnahme eines Eingangssignals und zur Weiterleitung von diesem entsprechenden Ausgangssignalen in parallel arbeitenden Schaltungszweigen

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3764992A (en) * 1972-02-14 1973-10-09 Bell Telephone Labor Inc Program-variable clock pulse generator
US3787817A (en) * 1972-06-21 1974-01-22 Us Navy Memory and logic module
US3783254A (en) * 1972-10-16 1974-01-01 Ibm Level sensitive logic system
US3946255A (en) * 1974-04-25 1976-03-23 Honeywell Inc. Signal generator
US3983538A (en) * 1974-05-01 1976-09-28 International Business Machines Corporation Universal LSI array logic modules with integral storage array and variable autonomous sequencing

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0372896U (en]) * 1989-11-16 1991-07-23

Also Published As

Publication number Publication date
IT1114796B (it) 1986-01-27
DE2723707A1 (de) 1978-01-05
JPS533143A (en) 1978-01-12
GB1581866A (en) 1980-12-31
DE2723707C2 (de) 1982-08-19
FR2356996B1 (en]) 1980-06-27
FR2356996A1 (fr) 1978-01-27
US4063078A (en) 1977-12-13

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